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Kind code of ref document: US USB1 en Power assisted automatic supervised classifier creation tool for semiconductor defects. Image analyzing method for detecting significant changes in a time sequence of images.
Apparatus and methods for searching through and analyzing defect images and wafer maps. System and method for invoking execution of a sequence of operations that includes motion control, machine vision, and data acquisition DAQ functionality. Feature-based detection and context discriminate classification for digital images. Feature-based detection and context discriminate classification for known image structures.
System and method for detecting and reporting fabrication defects using a multi-variant image analysis. Method and apparatus for developing synthetic three-dimensional models from imagery. Object detection apparatus, learning apparatus, object detection system, object detection method and object detection program. Method for checking the pattern density of a semiconductor chip design with variable checking box size and variable stepping distance. Method of triggering a detector to detect a moving feature within a video stream.
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